Parat, Krishna K.: search on Z-Library

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1

[IEEE 2012 IEEE International Electron Devices Meeting (IEDM) - San Francisco, CA, USA (2012.12.10-2012.12.13)] 2012 International Electron Devices Meeting - Scaling directions for 2D and 3D NAND cells

Goda, Akira, Parat, Krishna

Year:

2012

Language:

english

File:

PDF, 531 KB

english, 2012

2

[IEEE 2010 IEEE International Electron Devices Meeting (IEDM) - San Francisco, CA, USA (2010.12.6-2010.12.8)] 2010 International Electron Devices Meeting - 25nm 64Gb MLC NAND technology and scaling challenges invited paper

Prall, Kirk, Parat, Krishna

Year:

2010

Language:

english

File:

PDF, 687 KB

english, 2010

3

[IEEE 2009 IEEE International Electron Devices Meeting (IEDM) - Baltimore, MD, USA (2009.12.7-2009.12.9)] 2009 IEEE International Electron Devices Meeting (IEDM) - Investigation of ballistic current in scaled Floating-gate NAND FLASH and a solution

Raghunathan, Shyam, Krishnamohan, Tejas, Parat, Krishna, Saraswat, Krishna

Year:

2009

Language:

english

File:

PDF, 1.16 MB

english, 2009

4

[IEEE 2013 5th IEEE International Memory Workshop (IMW) - Monterey, CA, USA (2013.05.26-2013.05.29)] 2013 5th IEEE International Memory Workshop - Engineering a planar NAND cell scalable to 20nm and beyond

Ramaswamy, Nirmal, Graettinger, Thomas, Puzzilli, Giuseppina, Liu, Haitao, Prall, Kirk, Gowda, Srivardhan, Furnemont, Arnaud, Kim, Changhan, Parat, Krishna

Year:

2013

Language:

english

File:

PDF, 1.37 MB

english, 2013

5

[IEEE 2007 65th Annual Device Research Conference - South Bend, IN, USA (2007.06.18-2007.06.20)] 2007 65th Annual Device Research Conference - Feasibility Study of Composite Dielectric Tunnel Barriers for Flash Memory

Verma, Sarves, Pop, Eric, Kapur, Pawan, Majhi, Prashant, Parat, Krishna, Saraswat, Krishna C.

Year:

2007

Language:

english

File:

PDF, 793 KB

english, 2007

6

Operational Voltage Reduction of Flash Memory Using High-$\kappa$ Composite Tunnel Barriers

Verma, Sarves, Pop, Eric, Kapur, Pawan, Parat, Krishna, Saraswat, Krishna C.

Journal:

IEEE Electron Device Letters

Year:

2008

Language:

english

File:

PDF, 182 KB

english, 2008

7

SPIE Proceedings [SPIE Orlando '90, 16-20 April - Orlando, FL (Monday 16 April 1990)] Electro-Optical Materials for Switches, Coatings, Sensor Optics, and Detectors - Annealing characteristics of Hg1-xCdxTe grown by organometallic vapor phase epitaxy

Parat, Krishna K., Taskar, Nikhil R., Bhat, Ishwara B., Ghandhi, Sorab K., Hartmann, Rudolf, Soileau, M. J., Varadan, Vijay K.

Year:

1990

Language:

english

File:

PDF, 345 KB

english, 1990

8

[IEEE 2013 IEEE Hot Chips 25 Symposium (HCS) - Stanford, CA (2013.8.25-2013.8.27)] 2013 IEEE Hot Chips 25 Symposium (HCS) - NAND technology

Year:

2013

Language:

english

File:

PDF, 25.66 MB

english, 2013

9

Melt filaments in n+pn+ lateral bipolar ESD protection devices

Neal K. Clark, Krishna Parat, Timothy J. Maloney, Yudong Kim

Journal:

Journal of Electrostatics

Year:

1996

Language:

english

File:

PDF, 1.09 MB

english, 1996

10

[IEEE 2009 IEEE Workshop on Microelectronics and Electron Devices (WMED) - Boise, Idaho, USA (2009.04.3-2009.04.3)] 2009 IEEE Workshop on Microelectronics and Electron Devices - 3D Simulation Study of Cell-Cell Interference in Advanced NAND Flash Memory

Liu, Haitao, Groothuis, Steve, Mouli, Chandra, Li, Jian, Parat, Krishna, Krishnamohan, Tejas

Year:

2009

Language:

english

File:

PDF, 260 KB

english, 2009

11

Sulphur diffusion into InP by an open tube process

Krishna K. Parat, Sorab K. Ghandhi

Journal:

Solid-State Electronics

Year:

1988

Language:

english

File:

PDF, 393 KB

english, 1988

12

[IEEE 2008 IEEE International Reliability Physics Symposium (IRPS) - Phoenix, AZ, USA (2008.04.27-2008.05.1)] 2008 IEEE International Reliability Physics Symposium - Statistical Modeling of Leakage Currents Through SiO2/High-κ Dielectrics Stacks for Non-Volatile Memory Applications

Padovani, Andrea, Larcher, Luca, Verma, Sarves, Pavan, Paolo, Majhi, Prashant, Kapur, Pawan, Parat, Krishna, Bersuker, Gennadi, Saraswat, Krishna

Year:

2008

Language:

english

File:

PDF, 258 KB

english, 2008

13

[IEEE 2009 International Symposium on VLSI Technology, Systems, and Applications (VLSI-TSA) - Hsinchu, Taiwan (2009.04.27-2009.04.29)] 2009 International Symposium on VLSI Technology, Systems, and Applications - Recent developments in NAND flash scaling

Year:

2009

File:

PDF, 848 KB

2009

14

-type Nanodot Flash Cell

Yeh, Chun-Chen, Holtzclaw, Karl, Ramaswamy, Nirmal, Gowda, Srivardhan, Brewer, Rhett, Graettinger, Thomas, Min, Kyu, Mouli, Chandra, Parat, Krishna, Ma, T. P.

Journal:

IEEE Electron Device Letters

Year:

2008

Language:

english

File:

PDF, 167 KB

english, 2008

15

[IEEE 2008 9th International Conference on Ultimate Integration on Silicon (ULIS) - Udine, Italy (2008.03.12-2008.03.14)] 2008 9th International Conference on Ultimate Integration of Silicon - Feasibility of SIO2/Al2O3 tunnel dielectric for future Flash memories generations

Padovani, Andrea, Larcher, Luca, Verma, Sarves, Pavan, Paolo, Majhi, Prashant, Kapur, Pawan, Parat, Krishna, Bersuker, Gennadi, Saraswat, Krishna

Year:

2008

File:

PDF, 186 KB

2008

16

[IEEE 2009 IEEE International Memory Workshop (IMW) - Monterey, CA, USA (2009.05.10-2009.05.14)] 2009 IEEE International Memory Workshop - A Novel Fluorine Incorporated Band Engineered (BE) Tunnel (SiO2/ HfSiO/ SiO2) TANOS with Excellent Program/Erase & Endurance to 10^5 Cycles

Verma, Sarves, Bersuker, Gennadi, Gilmer, David C., Padovani, Andrea, Park, H., Nainani, Aneesh, Heh, Dawei, Huang, Jeff, Jiang, Jack, Parat, Krishna, Kirsch, Paul D., Larcher, Luca, Tseng, Hsing-Huan

Year:

2009

Language:

english

File:

PDF, 988 KB

english, 2009

17

[IEEE 2010 Silicon Nanoelectronics Workshop (SNW) - Honolulu, HI, USA (2010.06.13-2010.06.14)] 2010 Silicon Nanoelectronics Workshop - Nanoscale memories for compute applications

Year:

2010

Language:

english

File:

PDF, 195 KB

english, 2010

18

[IEEE 2015 IEEE International Memory Workshop (IMW) - Monterey, CA, USA (2015.5.17-2015.5.20)] 2015 IEEE International Memory Workshop (IMW) - Characterization and Modeling of Advanced Placement Algorithms for NAND Flash Arrays

Miccoli, Carmine, Sarpatwari, Karthik, Di Cicco, Domenico, Cichocki, Mattia, Moschiano, Violante, Ruby, Paul, Parat, Krishna

Year:

2015

Language:

english

File:

PDF, 338 KB

english, 2015

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